“A determination that a patent claim is invalid for failing to meet the definiteness requirement in 35 U.S.C. § 112 . . . is a legal question reviewed de novo.”
How later courts described this case
- “A determination that a patent claim is invalid for failing to meet the definiteness requirement in 35 U.S.C. § 112 . . . is a legal question reviewed de novo.”
- “Our case law is clear that the objective boundaries requirement applies to terms of degree.”
- “Absent a clear disavowal or contrary definition in the specification or the prosecution history, the patentee is entitled to the full scope of its claim language.”
- explaining that a claim that did not include an upper limit on particle diameter “expressly reach[ed]” all such particles with a diameter greater than the stated minimum, and that “no limitation [was] required as a matter of definiteness”
Written by the judges who cited it.
The opinion
IN THE UNITED STATES DISTRICT COURT
FOR THE MIDDLE DISTRICT OF NORTH CAROLINA
THE TRUSTEES OF PURDUE )
UNIVERSITY, )
)
Plaintiff, )
)
v. ) 1:21-cv-840
)
WOLFSPEED, INC., )
)
Defendant. )
CLAIM CONSTRUCTION MEMORANDUM OPINION AND ORDER
OSTEEN, JR., District Judge
This matter is before this court for claim construction of
terms in U.S. Patent No. 7,498,633 (“the ‘633 Patent”). The
parties — Plaintiff, the Trustees of Purdue University, and
Defendant Wolfspeed, Inc. — do not dispute the construction of
several previously-disputed claim terms, so those terms no longer
require construction. (Joint Notice Regarding Dropped Claim Terms
(Doc. 124) at 1.) The parties disagree as to the construction of
four claim terms in Claims 9 and 10 of the ‘633 Patent, and they
have submitted proposed constructions of those terms. (Ex. A
(“Claim Construction Summary”) (Doc. 85-1) at 1–12.) Both parties
have submitted opening claim construction briefs, (Doc. 103
(Plaintiff); Doc. 104 (Defendant)), as well as responsive briefs,
(Doc. 117 (Plaintiff); Doc. 118 (Defendant)). This court held a
claim construction hearing on May 5, 2023, at which time this
court took this matter under advisement. (Minute Entry
05/05/2023.) For the reasons set forth herein, this court
concludes as follows:
Plaintiff’s Defendant’s Court’s
Claim Term
Construction Construction Construction
“a first source No construction Claim 9’s use No construction
electrode necessary of the necessary
formed over the terms “first”
first source and “second”
region” / “a requires
second source distinct
electrode elements (i.e.,
formed over the the “first
second source source
region” (Claim electrode” must
9) be distinct
from the
“second
source
electrode”)
“a JFET region No construction Indefinite No construction
defined between necessary necessary
the first
source region
and the second
source region”
(Claim 9)
“the JFET No construction Indefinite No construction
region having a necessary necessary,
width less than subject to
about three supplemental
micrometers” briefing
(Claim 9)
“the JFET No construction Indefinite No construction
region having a necessary necessary,
width of about subject to
one micrometer” supplemental
(Claim 10, briefing
depends from
Claim 9)
I. LEGAL STANDARD
In Markman v. Westview Instruments, Inc., 517 U.S. 370
(1996), the Supreme Court clarified which issues in a patent
trial are properly reserved for the jury and which are questions
of law to be determined by the court. Specifically, the Court
held that interpretation of language in patent claims “is an
issue for the judge, not the jury[.]” Id. at 391. The Federal
Circuit has provided further guidance on how to interpret patent
claims, stating that, in general, courts are to give the words of
a claim “their ordinary and customary meaning” as understood by
“a person of ordinary skill in the art in question at the time of
the invention[.]” Phillips v. AWH Corp., 415 F.3d 1303, 1312–13
(Fed. Cir. 2005) (en banc) (citations omitted).
In construing claim terms, courts are directed to consult
several specific types of evidence to discern what a person of
ordinary skill in the art would understand the term to mean.
Because the meaning of a claim term as understood by
persons of skill in the art is often not immediately
apparent, and because patentees frequently use terms
idiosyncratically, the court looks to “those sources
available to the public that show what a person of
skill in the art would have understood disputed claim
language to mean.” Those sources include “the words of
the claims themselves, the remainder of the
specification, the prosecution history, and extrinsic
evidence concerning relevant scientific principles, the
meaning of technical terms, and the state of the art.”
Id. at 1314 (citations omitted).
First, “the claims themselves provide substantial guidance
as to the meaning of particular claim terms.” Id. (citation
omitted). “To begin with, the context in which a term is used in
the asserted claim can be highly instructive.” Id. Federal
Circuit case law “provide[s] numerous . . . examples in which the
use of a term within the claim provides a firm basis for
construing the term.” Id. (citations omitted).
Other claims of the patent in question, both
asserted and unasserted, can also be valuable sources
of enlightenment as to the meaning of a claim term.
Because claim terms are normally used consistently
throughout the patent, the usage of a term in one claim
can often illuminate the meaning of the same term in
other claims. Differences among claims can also be a
useful guide in understanding the meaning of particular
claim terms. For example, the presence of a dependent
claim that adds a particular limitation gives rise to a
presumption that the limitation in question is not
present in the independent claim.
Id. at 1314-15 (citations omitted). “The words of a claim are
generally given their ordinary and customary meaning as
understood by a person of ordinary skill in the art when read in
the context of the specification and prosecution history.”
Thorner v. Sony Comput. Entm’t Am. LLC, 669 F.3d 1362, 1365 (Fed.
Cir. 2012) (citation omitted).
The second type of evidence the court should consider is the
specification, which “contains a written description of the
invention that must enable one of ordinary skill in the art to
make and use the invention.” See Markman v. Westview Instruments,
Inc., 52 F.3d 967, 979 (Fed. Cir. 1995) (en banc), aff’d, 517
U.S. 370 (1996); see also Phillips, 415 F.3d at 1315. “Claims
must be read in view of the specification, of which they are a
part.” Markman, 52 F.3d at 979 (citations omitted). The claims
define the invention, but “the specification ‘is always highly
relevant to the claim construction analysis. Usually, it is
dispositive; it is the single best guide to the meaning of a
disputed term.’” Phillips, 415 F.3d at 1315 (citation omitted).
“For claim construction purposes, the description may act as a
sort of dictionary, which explains the invention and may define
terms used in the claims.” Markman, 52 F.3d at 979 (citation
omitted). “[A] patentee is free to be his own
lexicographer[, but] . . . any special definition given to a word
must be clearly defined in the specification.” Id. at 980
(citations omitted). “[C]laims are not to be interpreted by
adding limitations appearing only in the specification. . . .
[P]articular embodiments appearing in a specification will not be
read into the claims when the claim language is broader than such
embodiments.” Electro Med. Sys., S.A. v. Cooper Life Scis., Inc.,
34 F.3d 1048, 1054 (Fed. Cir. 1994) (citations omitted). A
limitation from the specification should only be read into the
claims when the specification requires that limitation. See id.
The third type of evidence that a court should consider is
the patent’s prosecution history. See Phillips, 415 F.3d at 1317;
see also Markman, 52 F.3d at 980; Vitronics Corp. v.
Conceptronic, Inc., 90 F.3d 1576, 1582 (Fed. Cir. 1996). “This
‘undisputed public record’ of proceedings in the Patent and
Trademark Office is of primary significance in understanding the
claims.” Markman, 52 F.3d at 980 (citation omitted). “The
prosecution history limits the interpretation of claim terms so
as to exclude any interpretation that was disclaimed during
prosecution. Claims may not be construed one way in order to
obtain their allowance and in a different way against accused
infringers.” Southwall Techs., Inc. v. Cardinal IG Co., 54 F.3d
1570, 1576 (Fed. Cir. 1995) (citations omitted).
There are two relevant exceptions to the general rule that
claim terms “are generally given their ordinary and customary
meaning as understood by a person of ordinary skill in the
art[.]” Thorner, 669 F.3d at 1365 (citation omitted).
First, the claim term will not receive its ordinary
meaning if the patentee acted as his own lexicographer
and clearly set forth a definition of the disputed
claim term in either the specification or prosecution
history. Second, a claim term will not carry its
ordinary meaning if the intrinsic evidence shows that
the patentee distinguished that term from prior art on
the basis of a particular embodiment, expressly
disclaimed subject matter, or described a particular
embodiment as important to the invention.
CCS Fitness, Inc. v. Brunswick Corp., 288 F.3d 1359, 1366–67
(Fed. Cir. 2002) (citations omitted); see also Thorner, 669 F.3d
at 1365.
The redefinition of a claim term away from its ordinary
meaning must be clear “so as to put one reasonably skilled in the
art on notice that the patentee intended to so redefine the claim
term.” Bell Atl. Network Servs., Inc. v. Covad Commc’ns Grp.,
Inc., 262 F.3d 1258, 1268 (Fed. Cir. 2001) (citations omitted).
However, redefinition need not be explicit. Id. “[T]he
specification may define claim terms ‘by implication’ such that
the meaning may be ‘found in or ascertained by a reading of the
patent documents.’” Id. (citation omitted); see also Trs. of
Columbia Univ. v. Symantec Corp., 811 F.3d 1359, 1364 (Fed. Cir.
2016).
“The party seeking to invoke prosecution history disclaimer
bears the burden of proving the existence of a ‘clear and
unmistakable’ disclaimer that would have been evident to one
skilled in the art.” Mass. Inst. of Tech. v. Shire Pharm., Inc.,
839 F.3d 1111, 1119 (Fed. Cir. 2016) (citation omitted); see also
Omega Eng’g, Inc., v. Raytek Corp., 334 F.3d 1314, 1324 (Fed.
Cir. 2003) (stating that a disclaimer occurs “where the patentee
has unequivocally disavowed a certain meaning to obtain his
patent”). Said disavowal must be clear and may not be “too vague
or ambiguous[.]” Omega Eng’g, 334 F.3d at 1325 (citation
omitted).
Evidence from sources other than the claims, the
specification, and the prosecution history is extrinsic and
generally should be relied upon only when the intrinsic evidence
fails to resolve any ambiguity in a disputed term. See Vitronics
Corp., 90 F.3d at 1583; see also Phillips, 415 F.3d at 1318–19.
Extrinsic evidence includes “expert and inventor testimony,
dictionaries, and learned treatises.” Markman, 52 F.3d at 980. A
court may use extrinsic evidence to aid its understanding of a
patent, but “not for the purpose of varying or contradicting the
terms of the claims.” Id. at 981 (citations omitted).
Accordingly, the Federal Circuit has stated that “expert
testimony, whether it be of an attorney, a technical expert, or
the inventor, on the proper construction of a disputed claim term
. . . . may only be relied upon if the patent documents, taken as
a whole, are insufficient to enable the court to construe
disputed claim terms.” Vitronics Corp., 90 F.3d at 1585 (emphasis
omitted). In such “rare instances,” prior art documents and
dictionaries are preferable to expert testimony because they are
objective, reliable, and “accessible to the public in advance of
litigation.” Id.
Separate from but related to claim construction is the issue
of patent invalidity for indefiniteness. “[I]ndefiniteness is a
question of law and in effect part of claim construction.” ePlus,
Inc. v. Larson Software, Inc., 700 F.3d 509, 517 (Fed. Cir.
2012). A patent claim is invalid for indefiniteness under 35
U.S.C. § 112 “if its claims, read in light of the specification
delineating the patent, and the prosecution history, fail to
inform, with reasonable certainty, those skilled in the art about
the scope of the invention.” Nautilus, Inc. v. Biosig
Instruments, Inc., 572 U.S. 898, 901 (2014). Like claim
construction, determining invalidity is a legal question for the
court to evaluate. Young v. Lumenis, Inc., 492 F.3d 1336, 1344
(Fed. Cir. 2007) (“A determination that a patent claim is invalid
for failing to meet the definiteness requirement in 35 U.S.C.
§ 112 . . . is a legal question reviewed de novo.”). “The
definiteness requirement must take into account the inherent
limitations of language, but at the same time, the patent must be
precise enough to afford clear notice of what is claimed, thereby
apprising the public of what is still open to them.” Fairfield
Indus., Inc. v. Wireless Seismic, Inc., No. 4:14-CV-2972, 2015 WL
1034275, at *4 (S.D. Tex. Mar. 10, 2015) (citing Nautilus, 572
U.S. at 907–911). “The definiteness requirement ‘mandates
clarity, while recognizing that absolute precision is
unattainable.’” Presidio Components, Inc. v. Am. Tech. Ceramics
Corp., 875 F.3d 1369, 1375 (Fed. Cir. 2017) (quoting Nautilus,
572 U.S. at 910).
A key difference between claim construction versus the issue
of invalidity for indefiniteness relates to burden of proof; in
claim construction, there is no burden of proof assigned to
either party, whereas with invalidity for indefiniteness, patents
are presumed to be valid and the patent challenger has the burden
of proving invalidity by clear and convincing evidence. See
Microsoft Corp. v. I4I Ltd. P’ship, 564 U.S. 91, 95 (2011);
Takeda Pharm. Co. v. Zydus Pharms. USA, Inc., 743 F.3d 1359, 1366
(Fed. Cir. 2014).
II. BRIEF OVERVIEW OF THE ‘633 PATENT
At issue here is the ‘633 Patent, entitled “High-Voltage
Power Semiconductor Device.” (‘633 Patent (Doc. 83-1) at 2.)1 The
Patent claims particular double-implanted MOSFETS, which — at a
high level — act like electric switches allowing or preventing
current to flow from an electrode source to drain. A MOSFET
device switches and regulates current in electric circuits by
creating static electronic fields in a semiconductor material.
1 All citations in this Memorandum Opinion and Order to
documents filed with the court refer to the page numbers located
at the bottom right-hand corner of the documents as they appear
on CM/ECF.
(See Ex. 1, Expert Report of W. Allen Doolittle, Ph.D. Concerning
Construction of Certain Terms in U.S. Patent No. 7,498,633
(“Doolittle Report”) (Doc. 104-1) at 13.) A vertical MOSFET
device consists of several layers: the gate electrode, gate
oxide, source electrodes, a series of semiconductor drift layers
of differing polarities, and a lower drain layer. (Id. at 13–14.)
Current flows through a channel in the drift layer from the
source to the drain. (See id. at 14 n.1.) Applying a static
electric field transverse to the current flow creates a “field
effect” that impacts the conductance of a semiconductor device.
(See id. at 13.)
When a MOSFET device is in the on-state, an electric field
forms across the oxide layer of the device and permeates into the
semiconductor; this creates a channel in which electrons flow
from the source region through the drift layer of the device and
into the drain terminal. (Id. at 15.) In the off-state, there is
a high resistance in the drift layer that blocks voltage applied
to the MOSFET device. (See id. at 15–16.) The JFET region in a
MOSFET device is formed from “pinch[ing] [of] current flow from
source to drain[,] thus increase[ing] . . . resistance.” (Id.
at 17.)
A major “design consideration” in MOSFETS appears to be
balancing a “high blocking voltage” with a low “on-resistance of
the semiconductor device” because a decreased on-resistance
improves the semiconductor device’s efficiency. (‘633 Patent
(Doc. 83-1) at 7.) “However, the typical fabrication techniques
for reducing the specific on-resistance of high-voltage power
semiconductor devices may also reduce the blocking voltage of the
device.” (Id.) As a result, blocking voltage and on-resistance
appear to be inversely correlated, where both a high blocking
voltage and a low on-resistance are desirable. (See id.) “A JFET
region that was too wide would result in the field across the
gate oxide in the blocking state to exceed the electric field for
oxide breakdown, thus damaging the gate oxide.” (Ex. 2, Expert
Report of Stanley Shanfield, Ph.D. (“Shanfield Report”)
(Doc. 103-2) at 17.) “On the other hand, a JFET region that was
too narrow would increase the on-state resistance, contrary to
the design goal” of the MOSFET device. (Id. at 17–18.)
Plaintiff asserts the ‘633 Patent, which is directed towards
high-voltage metal-oxide semiconductor field-effect transistors
with silicon carbide substrates. (‘633 Patent (Doc. 83-1) at 1,
8.) The parties dispute four claim terms in Claims 9 and 10 of
the ‘633 Patent, and the parties’ positions on those terms are
listed below:
Plaintiff’s Defendant’s
Claim Term
Construction Construction
“a first source No construction Claim 9’s use of the
electrode formed necessary terms “first” and
over the first “second” requires
source region” / “a distinct elements
second source (i.e., the “first
electrode formed source electrode”
over the second must be distinct
source region” from the “second
(Claim 9) source electrode”)
“a JFET region No construction Indefinite
defined between the necessary
first source region
and the second
source region”
(Claim 9)
“the JFET region No construction Indefinite
having a width less necessary
than about three
micrometers” (Claim
9)
“the JFET region No construction Indefinite
having a width of necessary
about one
micrometer” (Claim
10, depends from
Claim 9)
III. ANALYSIS
A. “a first source electrode formed over the first source
region” / “a second source electrode formed over the
second source region”
Plaintiff’s Defendant’s
Claim Term
Construction Construction
“a first source No construction Claim 9’s use of the
electrode formed necessary terms “first” and
over the first “second” requires
source region” / “a distinct elements
second source (i.e., the “first
electrode formed source electrode”
over the second must be distinct
source region” from the “second
(Claim 9) source electrode”)
Defendant argues that the use of “first” and “second”
specifying the source electrodes and their positions in Claim 9
requires a covered MOSFET device to have two distinct source
electrodes, one for each source region. (Def.’s Opening Claim
Construction Br. (Doc. 104) at 14–18.) Defendant cites the
express language of the claim term, the drawings included in the
‘633 Patent’s specification, and the ‘633 Patent’s prosecution
history in support. (See id.) Specifically, Defendant argues that
the express language of the claim term uses “first” and “second”
as qualifiers for the “source electrodes,” such that each source
electrode must be a separate and distinct element, not a unitary
source electrode for both source regions on the MOSFET device.
(Id. at 14–15.) Defendant next contends that the specification
further supports this construction because the figures of the
‘633 Patent “consistently illustrate the electrodes as separate
and distinct” and because the specification discusses each source
electrode “respective[]” to each source region.” (Id. at 15–16.)
Finally, Defendant argues that the prosecution history supports
its proposed construction because the terms “first” and “second”
were added as amendments during patent prosecution to
differentiate the ‘633 Patent from a prior art, U.S. Patent
No. 6,573,534 (“the ‘534 Patent”), which uses a unitary source
electrode. (Id. at 16–18.) At the claim construction hearing,
Defendant further refined this argument by contending that while
the first and second source electrodes must be separate and
distinct elements, they may still be electrically connected.
Plaintiff refutes Defendant’s reading of the claim term,
arguing that it is inconsistent with the specification. (Pl.’s
Opening Claim Construction Br. (Doc. 103) at 28–30.) Plaintiff
argues that the claim covers both:
(1) MOSFETS where there are two unique source
electrodes, one formed over the first source region and
one formed over the second source region, and
(2) MOSFETS where there is a single, unitary source
electrode that is spatially separated when forming over
both the first source region and the second source
region.
(Id.) The parties do not dispute that the former MOSFET device
with two unique source electrodes is covered by the ‘633 Patent.
Defendant proposes a construction that narrows the ‘633 Patent;
only the former is covered, and the latter MOSFET device with a
unitary source electrode is outside the Patent’s scope. In
support of its position that no construction is necessary,
Plaintiff references the specification, which states that in some
embodiments, “the source electrodes 50, 52 are coupled together
to form a unitary source electrode.” (Id. at 28 (citing ‘633
Patent (Doc. 83-1) at 10).) Plaintiff argues that this
expressly-contemplated embodiment precludes Defendant’s proposed
narrowing of the claim term. (Id. at 28.) Plaintiff further
argues that the patent prosecution history does not support
Defendant’s proposed construction of the claim term, as an
amendment during prosecution does not amount to an unambiguous
disavowal of any portion of the scope of the claim, including
embodiments explicitly discussed in the specification. (Pl.’s
Responsive Claim Construction Br. (Doc. 117) at 15–16.)
“[T]he claims made in the patent are the sole measure of the
grant,” see Phillips, 415 F.3d at 1312 (quotation omitted), and
the claim language explicitly specifies a “first” and a “second”
source electrode. “The use of the terms ‘first’ and ‘second’ is a
common patent-law convention to distinguish between repeated
instances of an element or limitation.” 3M Innovative Props. Co.
v. Avery Dennison Corp., 350 F.3d 1365, 1371 (Fed. Cir. 2003).
However, the cases Defendant cites for this proposition, although
constructing terms like “first” and “second,” do so in inapposite
contexts. For example, in 3M Innovative Properties, the Federal
Circuit held that numerical terms like “first” and “second” in a
claim term did not impose a serial or sequential order limitation
in the claim. Id. And the court in Gillette Co. v. Energizer
Holdings, Inc. held that numerical terms did not limit the number
of blades on a claim in the invention. 405 F.3d 1367, 1372 (Fed.
Cir. 2005). The types of patented subject matter in both cases
Defendant cites are dissimilar to the present case, and those
cases do not even consider the issue here — whether numerical
terms like “first” or “second” may cover a single element serving
dual roles in the claim.
In contrast, Plaintiff cites to Koninklijke Philips N.V. v.
Wangs All. Corp., which rejected the defendant’s argument that a
“second LED” required a “separate and distinct” light emitting
diode that was not physically and electronically connected to the
“first LED.” No. CV 14-12298-DJC, 2017 WL 6329616, at *11–12 (D.
Mass. Dec. 11, 2017). Like the present case, Koninklijke Philips
N.V. pertains to a patent for a semiconductor device, albeit a
different type of semiconductor. Id. at *1. Additionally, the
construction of “second” in Koninklijke Philips N.V. implicates
similar issues as the present case — whether use of language like
“first” and “second” requires two distinct electricity sources,
or whether a single source that connects to two regions on an
electrode is also covered by the claim language. Id. at *11–12.
Koninklijke Philips N.V. rejected the defendant’s proposed
narrowing of the claim scope and concluded that no construction
was necessary, explaining that the court would “not reinterpret
the claim language where it is sufficiently clear and where the
specification discloses embodiments electronically and physically
grouped together.” Id. at *12.
In light of the specification, the terms “first” and
“second” in the ‘633 Patent do not require the first and second
electrodes to be electrically or physically disconnected, as
Defendant contends. The specification explicitly considers and
includes the possibility of a single source electrode. In its
description of Figure 1, the specification states:
A source metallic electrode 50, 52 is formed over the
source regions 46, 48 respectively. In some
embodiments, the source electrodes 50, 52 are coupled
together to form a unitary source electrode.
. . .
The semiconductor device 10 may be electrically coupled
with other electrical devices, sources, or the like via
the electrodes. . . .
(‘633 Patent (Doc. 83-1) at 10 (emphasis added).) Even though
“the claims made in the patent are the sole measure of the
grant,” a claim term “can be defined only in a way that comports
with the instrument as a whole.” Phillips, 415 F.3d at 1312.
Further, “a claim interpretation that excludes a preferred
embodiment from the scope of the claim is rarely, if ever,
correct.” On-Line Techs., Inc. v. Bodenseewerk Perkin-Elmer GmbH,
386 F.3d 1133, 1138 (Fed. Cir. 2004) (internal citation and
quotations omitted).
The parties do not dispute that embodiments where the source
electrodes are distinct and decoupled are covered within the
scope of the ‘633 Patent. (Compare Pl.’s Opening Claim
Construction Br. (Doc. 103) at 28–30, with Def.’s Opening Claim
Construction Br. (Doc. 104) at 14–18.) The specification
explicitly considers and chooses to include embodiments where a
single electrode is used for both the “first” and the “second”
source regions. (‘633 Patent (Doc. 83-1) at 10.) Defendant’s
proposed construction would narrow the claim to exclude an
expressly-included embodiment. The claim language, in light of
the specification, is “sufficiently clear” and contemplates
MOSFETs with a single unitary source electrode formed over the
“first” and “second” source regions.
Defendant references the ‘633 Patent’s prosecution history
to argue that the March 12, 2008 amendment to Claim 9 — which
added the “first” and “second” language at issue to Claim 9 —
shows that the claim was amended to require a distinct “first
source electrode” and “second source electrode” to distinguish
the ‘633 Patent from a prior art with a single unitary source
electrode. (Def.’s Opening Claim Construction Br. (Doc. 104)
at 16–17, see also Ex. C (Doc. 104-3) at 42.) However, the
amendment alone does not demonstrate that its purpose was to
distinguish from a prior art that included a single source
electrode, particularly as the remarks to that amendment show
that the amendment was also in response to the Patent Examiner’s
proposed combination of three different prior art references.
(See Ex. C (Doc. 104-3) at 10–11, 47–48.) Finding disclaimer of
claim scope based on prosecution history requires “a clear and
unmistakable disavowal of scope during prosecution.” Purdue
Pharma L.P. v. Endo Pharm. Inc., 438 F.3d 1123, 1136 (Fed. Cir.
2006). Ambiguous statements in prosecution history are not enough
to support limiting claim scope, particularly when the
applicant’s statements may be subject to multiple
interpretations. SanDisk Corp. v. Memorex Prods., Inc., 415 F.3d
1278, 1287 (Fed. Cir. 2005) (“There is no ‘clear and
unmistakable’ disclaimer if a prosecution argument is subject to
more than one reasonable interpretation, one of which is
consistent with a proffered meaning of the disputed term.”). The
amendment alone, given the specification’s inclusion of an
embodiment with a unitary source electrode, is not a “clear and
unmistakable disavowal of scope.” See Purdue Pharma L.P., 438
F.3d at 1136.
In sum, reading the “instrument as a whole,” see Phillips,
415 F.3d at 1316, this court concludes that no construction is
necessary for the term “a first source electrode formed over the
first source region” and “a second source electrode formed over
the second source region.”
Defendant also raises the issue that the ‘534 Patent already
covers a MOSFET with a unitary source electrode. (Def.’s Opening
Claim Construction Br. (Doc. 104) at 16–18.) Plaintiff’s proposed
construction of the ‘633 Patent, which this court adopts,
explicitly contemplates a unitary source electrode. Defendant
argues that during prosecution of the ‘633 Patent, Plaintiff
amended the claim at issue to specifically distinguish from the
‘534 Patent’s use of a unitary source electrode. (Id.) However,
invalidity due to anticipation by a prior art reference is a
factual question for summary judgment or trial. See Oney v.
Ratliff, 182 F.3d 893, 895 (Fed. Cir. 1999) (“Although
anticipation is a question of fact, it still may be decided on
summary judgment if the record reveals no genuine dispute of
material fact.”). This court need not reach this issue during
claim construction.
B. “a JFET region defined between the first source region
and the second source region”
Plaintiff’s Defendant’s
Claim Term
Construction Construction
“a JFET region No construction Indefinite
defined between the necessary
first source region
and the second
source region”
(Claim 9)
Defendant argues that the claim term — “a JFET region
defined between the first source region and the second source
region” — is indefinite because of an alleged inconsistency
between the term’s plain language (which requires the JFET region
to be bordered by the first and second source regions), and the
specification (which defines the JFET region as bound by the two
p-wells). (Def.’s Opening Claim Construction Br. (Doc. 104)
at 19–20.) Relying on testimony from its expert, Dr. Doolittle,
Defendant argues that this inconsistency between the claim term
and the specification means that the width of the JFET region
will vary depending on the boundaries from which it is measured.
(Id. at 20–21.) Dr. Doolittle explains that the explicit claim
language “results in the JFET region including a portion of the
first and second p-well regions 26 and 28.” (Doolittle Report
(Doc. 104-1) at 26.) However, he opines that “the specification
and figures of the ‘633 Patent describe the JFET region as
distinct from and defined between the p well regions of the
device.” (Id.)
Defendant contends that this inconsistency is meaningful
because the “variability could mean that a given MOSFET device
falls within or outside the scope of the claims depending on
where it is measured,” either “between the source regions or
p-wells.” (Def.’s Opening Claim Construction Br. (Doc. 104)
at 21.) Dr. Doolittle proffers an example, in which a MOSFET
device falls outside the scope of the ‘633 Patent when the JFET
region is defined between and measured between the source regions
(as stated in the claim language), while that MOSFET device falls
within the scope of the ‘633 Patent when the JFET region is
defined between and measured between the p-wells (as described in
the specification). (Doolittle Report (Doc. 104-1) at 28–29.)
According to Defendant, this inconsistency raises a “zone of
uncertainty” rendering the claim term indefinite, as the claim
term “is open to multiple interpretations reflecting markedly
different understandings of the patent’s scope.” (Def.’s Opening
Claim Construction Br. (Doc. 104) at 22 (quoting Nautilus, 572
U.S. at 909, 913).)
Defendant also argues that, regardless of whether the JFET
region is defined between the source regions or the p-wells, the
‘633 Patent fails to specify where the JFET region’s width is
measured, which varies due to the curvature of the p-well
boundaries. (Id. at 23–24.) Again, Defendant contends that a
given MOSFET device may fall within or outside the scope of the
‘633 Patent depending on where the JFET region’s width is
measured, creating an ambiguity rendering the claim term
indefinite. (Id. at 24, 26.)
Plaintiff argues that Defendant’s contention of
indefiniteness is pretextual because Defendant understood the
location of the JFET region during inter partes review of the
‘633 Patent.2 (Pl.’s Opening Claim Construction Br. (Doc. 103)
at 15–16.) Additionally, Plaintiff argues that the claim term is
not indefinite in light of the specification; instead, Plaintiff
2 Plaintiff’s argument concerning Defendant’s position
during inter partes review of the ‘633 Patent is not convincing.
The standard of review in an IPR proceeding is different from
that in district court litigation. In an IPR proceeding, the
burden of proving a claim invalid is preponderance of the
evidence. 35 U.S.C. § 316(e). However, when evaluating a claim
as invalid for indefiniteness, the patent challenger must prove
a claim invalid by clear and convincing evidence. Microsoft
Corp., 564 U.S. at 95; Takeda Pharm. Co., 743 F.3d at 1366.
Further, “[t]he statutory provisions governing the inter partes
review process do not permit the Board to institute inter partes
review of claims for indefiniteness. . . . [T]he petitioner in
the IPR proceeding below [is] thus not permitted to request that
the Board cancel claims . . . on the ground that they were
indefinite. Nor [can] the Board cancel those claims as
indefinite on its own accord.” Samsung Elecs. Am., Inc. v.
Prisua Eng’g Corp., 948 F.3d 1342, 1350–51 (Fed. Cir. 2020).
Thus, whether or not Defendant raised particular issues before
the Patent Trial and Appeal Board does not limit Defendant’s
arguments concerning indefiniteness before this court.
suggests Defendant’s expert narrows in on the claim term without
context of the specification to argue that the term is
indefinite. (Id. at 18–20.) More specifically, Plaintiff argues
that “the specification informs the claims by stating that the
JFET region is between the p well regions, thereby pointing to
exactly where the JFET region should be measured in the space
between the first source region and the second source region.”
(Pl.’s Responsive Claim Construction Br. (Doc. 117) at 7.) In
short, Plaintiff argues that the claim and specification are
consistent because “the JFET region is located between the p
wells, which also falls between the first source region and the
second source region.” (Id.)
Plaintiff also refutes Defendant’s argument concerning a
lack of guidance on where the JFET region’s width should be
measured, explaining that “the JFET region should be measured at
the narrowest point to achieve the intended design.” (Id. at 9.)
This is because Plaintiff contends a person of skill in the art
would know there is an optimum width that furthers the MOSFET
device’s design goal of “achiev[ing] the lowest possible
on-resistance while meeting the desired blocking voltage
specification.” (Id. (quoting Shanfield Report (Doc. 103-2)
at 17–18).)
This court finds that there is no inconsistency between the
claim term and the specification rendering the claim term
indefinite. However, this court, in a separate order, will
request supplemental briefing on the discrete argument Defendant
raises concerning where the JFET region’s width is measured.
Addressing Defendant’s argument concerning a purported
inconsistency between the claim term and the specification, this
court starts with intrinsic evidence, as “it is improper to rely
on extrinsic evidence” when intrinsic evidence alone will resolve
any ambiguity. See Vitronics Corp., 90 F.3d at 1583. Considering
the claim term itself and the ordinary meaning that would be
attributed to the term by a person skilled in the relevant art,
“defined between” is a clear term that, by its plain language,
delineates or establishes the outer boundaries of the “JFET
region.” “There is a heavy presumption that claim terms are to be
given their ordinary and customary meaning.” Aventis Pharm. Inc.
v. Amino Chems. Ltd., 715 F.3d 1363, 1373 (Fed. Cir. 2013).
“Defined between” is used so ubiquitously in patent
specifications that this court has not found any caselaw
providing a precise and unambiguous definition of “defined” or
“defined between.” Even so, it is commonly used as a term to
delineate boundaries. See, e.g., Ascion, LLC v. Ashley Furniture
Indus., Inc., No. 2021-1857, 2022 WL 1197338, at *1 (Fed. Cir.
Apr. 22, 2022) (“body portion having a first top-to-bottom length
defined between the top edge and bottom surface”) (emphasis
added); Campbell Soup Co. v. Gamon Plus, Inc., No. 2020-2322,
2021 WL 3671366, at *1 (Fed. Cir. Aug. 19, 2021) (“The chutes 22,
24 are defined between adjacent pairs of panels 10 and are of a
width slightly greater than the width of products 90 [(e.g., soup
cans)] and which allow the products to be stored and dispensed
therefrom.”) (emphasis added); In re Smolak, 88 F.2d 838, 839
(C.C.P.A. 1937) (“intermediate portions of irregularly sloping
surfaces defined between the said elevated and depressed
portions”) (emphasis added). Accordingly, the claim term “defined
between” establishes the absolute boundaries of the “JFET region”
as the “first source region” and the ”second source region.”
However, the claim term must also be considered in light of
the entire ‘633 Patent, including the specification and drawings.
Cf. Funai Elec. Co. v. Daewoo Elecs. Corp., 616 F.3d 1357, 1371
(Fed. Cir. 2010) (“We affirm the district court’s claim
construction, for it is in accordance with the specification
including the drawings . . . .”). In Figure 1, the JFET region 30
is bounded on the left by p-well 26 and on the right by p-well
28. (‘633 Patent (Doc. 83-1) at 3.) In alignment with the claim
term, in Figure 1, the JFET region 30 is also between the first
source region on the left and the second source region on the
right. (Id.) Further, Claim 9 provides a range for the JFET
region’s possible width, and Dr. Shanfield explains that the JFET
region’s width may vary to optimize for “the lowest possible
on-resistance while meeting the desired blocking voltage
specification.” (Shanfield Report (Doc. 103-2) at 17.) As a
result, the JFET region must fall between the p-wells, as well as
the first and second source regions; even if the JFET region is
precisely bounded by the first and second source regions, it
still falls within the p-wells. Figure 1’s description in the
specification supports this construction of the claim term:
As illustrated in FIG. 1, the semiconductor device 10
also includes source regions 46, 48 defined in the “P”
wells 26, 28, respectively.
(‘633 Patent (Doc. 83-1) at 9 (emphasis added).) By the claim
specification, the first and second source regions are “in” the
p-wells, or at least overlap in location with the p-wells. (Id.)
Thus, although the claim term is arguably less precise than the
specification, the two are not inconsistent such that a person
skilled in the relevant art or the public would be unable to
understand the scope of the claim. The claim term, specification,
and Figure 1 taken together demonstrate the JFET region falls
between both the source regions and the p-wells, particularly
since the specification defines the source regions as “in” the
p-wells themselves. (See id. at 9.)
In support of its argument for indefiniteness, Defendant
cites to Allen Eng’g Corp. v. Bartell Indus., Inc., 299 F.3d 1336
(Fed. Cir. 2002) and Juxtacomm-Texas Software, LLC v. Axway,
Inc., No. 6:10CV011, 2012 WL 7637197 (E.D. Tex. July 5, 2012),
aff’d sub nom. JuxtaComm-Texas Software, LLC v. TIBCO Software,
Inc., 532 F. App’x 911 (Fed. Cir. 2013). (Def.’s Responsive Claim
Construction Br. (Doc. 118) at 11–12.) However, the alleged
inconsistency here is not like Allen Eng’g Corp., in which the
plaintiff unsuccessfully tried to claim a person skilled in the
relevant art would read “perpendicular” to mean “parallel.” 299
F.3d at 1349. A lack of specificity in the claim term, when the
specification provides that further detail, like here, is not
akin to claiming the opposite meaning of a word. Juxtacomm-Texas
Software is also not a meaningful comparison. In Juxtacomm-Texas
Software, the claims at issue stated that “data transformation
must occur within the systems interface,” whereas the patent
specification explained that the “systems interface merely
defines the scripts that perform data transformation.” 2012 WL
7637197, at *5–6. Whether an interface performs a particular task
outright or whether it writes a script that performs a task are
two different pieces of software. The issue in the present case
appears to be lack of precision, not a contradiction between the
claim and specification.
Accordingly, considering both the language of the claim and
the specification together, a person skilled in the relevant art
is informed “with reasonable certainty” of “the scope of the”
claim term “a JFET region defined between the first source region
and the second source region,” so it is not indefinite on those
grounds. See Nautilus, 572 U.S. at 901.
C. “the JFET region having a width less than about three
micrometers” and “the JFET region having a width of
about one micrometer”
Plaintiff’s Defendant’s
Claim Term
Construction Construction
“the JFET region No construction Indefinite
having a width less necessary
than about three
micrometers” (Claim
9)
“the JFET region No construction Indefinite
having a width of necessary
about one
micrometer” (Claim
10, depends from
Claim 9)
Defendant argues that both of these claim terms are
indefinite because the ‘633 Patent does not provide objective
boundaries for the JFET region’s width. (Def.’s Opening Claim
Construction Br. (Doc. 104) at 22–27.) Specifically, Defendant
argues that the claim term — “the JFET region having a width less
than about three micrometers” — is indefinite because the claim
term does not provide an upper or lower bound for the JFET
region’s width and because of the use of the word “about.” (Id.
at 27–33.) And Defendant argues that the claim term — “the JFET
region having a width of about one micrometer” — is indefinite
for the same reasons. (Id. at 33.) Defendant also appears to
restate this argument in other words in its responsive brief by
arguing that “[t]he patent fails to specify an objective upper
boundary.” (Def.’s Responsive Claim Construction Br. (Doc. 118)
at 15 (cleaned up).)
Plaintiff argues that Defendant’s argument about a lack of
objective bounds lacks merit because a person skilled in the
relevant art would know not to create a MOSFET with a JFET region
width of zero that renders the MOSFET inoperable. (Pl.’s Opening
Claim Construction Br. (Doc. 103) at 22–25.) Additionally,
Plaintiff argues that the word “about” is not indefinite given
inevitable variations in manufacturing processes. (Id. at 25–28.)
First, the use of the term “about” does not render either
claim term indefinite. “About” has an “ordinary meaning of
‘approximately.’” Merck & Co. v. Teva Pharms. USA, Inc., 395 F.3d
1364, 1369 (Fed. Cir. 2005). And neither the claims, nor the
specification, suggest the patentee has redefined the term
“about” away from its ordinary meaning. See id. at 1370. Thus,
the claim term “the JFET region having a width less than about
three micrometers” can be construed as meaning “the JFET region
having a width less than approximately three micrometers.” The
claim term “the JFET region having a width of about one
micrometer” can be construed as meaning “the JFET region having a
width of approximately one micrometer.”
In this context, “‘about’ is properly described as a ‘word
of degree’ or ‘term of degree.’” See Enviro Tech Chem. Servs.,
Inc. v. Safe Foods Corp., No. 4:21-CV-00601-LPR, 2022 WL
17721179, at *13 (E.D. Ark. Dec. 15, 2022). “Other courts have
found claim terms of approximation such as ‘about’ to have
sufficiently definite meaning on the basis of manufacturing
tolerances and/or rounding.” Glaukos Corp. v. Ivantis, Inc.,
No. SACV 18-620 JVS (JDEx), 2019 WL 8955768, at *11 (C.D. Cal.
Aug. 16, 2019) (collecting cases). Even so, terms of degree must
be sufficiently definite. Berkheimer v. HP Inc., 881 F.3d 1360,
1364 (Fed. Cir. 2018) (“Our case law is clear that the objective
boundaries requirement applies to terms of degree.”).
The ‘633 Patent uses the term “about” as a “term of degree”
to account for such manufacturing tolerances or variations, and
“about” is sufficiently definite as used in the ‘633 Patent.
Dr. Shanfield explains on behalf of Plaintiff that fabrication of
MOSFET devices “necessarily results in minor variations in
feature dimensions because of the equipment used and the
microscopic feature sizes.” (Shanfield Report (Doc. 103-2) at
16.) He explains that “while the average measurements of a device
will be close to the specified value across the thousands of dice
on a semiconductor device, any two devices made using the same
fabrication process will have some minor deviation from this
average.” (Id. at 16–17.) The manufacturing variations that
impact the width of the JFET region depend on several factors,
including transverse straggle and critical dimension tolerance.
(Id. at 17.) A person skilled in the art would understand that
the width of the JFET region depends upon a careful balance
between “the lowest possible on-resistance while meeting the
desired blocking voltage specification.” (Id.) A person skilled
in the art would also be informed about the JFET region’s width
by existing design criteria and by published literature. (Id.
at 18.) Accordingly, a person skilled in the relevant art would
know that while the JFET width can be specified precisely during
the design phase, “the JFET width after fabrication cannot be
specified to exact values,” only “a distribution with range and
standard deviation.” (Id. at 17.)
Dr. Doolittle acknowledges the possibility of manufacturing
variation, but he argues that “there is no universal or accepted
degree of variation that is considered acceptable in the field of
MOSFET design.” (Doolittle Report (Doc. 104-1) at 43.)
Specifically, he explains that “the degree of acceptable
variation depends on design goals [and] constraints,” but “the
‘633 Patent fails to specify any of those parameters that would
help a person of ordinary skill in the art understand the
acceptable degree of variation.” (Id. at 44.)
Using a term of degree, which permeates patent claims, is
not enough to render the claim term indefinite. Defendant demands
the claim include a numerical range of error to clarify the
meaning of “about,” but the Federal Circuit frequently refuses to
impose a more exact or numerically precise construction on terms
of degree. See, e.g., Anchor Wall Sys. v. Rockwood Retaining
Walls, Inc., 340 F.3d 1298, 1310–11 (Fed. Cir. 2003) (“[T]he
phrase ‘generally parallel’ envisions some amount of deviation
from exactly parallel,” and “words of approximation, such as
‘generally’ and ‘substantially,’ are descriptive terms commonly
used in patent claims to avoid a strict numerical boundary to the
specified parameter.”). Dr. Shanfield’s explanation that a person
skilled in the art would know to optimize “achiev[ing] the lowest
possible on-resistance while meeting the desired blocking voltage
specification,” (Shanfield Report (Doc. 103-2) at 17), when
designing a MOSFET device is akin to defining the patent term in
“functional terms, thereby saving it from indefiniteness.” See
Automated Packaging Sys., Inc. v. Free Flow Packaging Int’l,
Inc., No. 18-CV-00356-EMC, 2018 WL 3659014, at *17 (N.D. Cal.
Aug. 2, 2018) (explaining that the term “substantial” is a “term
of degree” that is rendered sufficiently definite because the
patent specification provides a functional purpose for the term).
In Automated Packaging Sys., the term “substantially” was
found sufficiently definite when used in the phrase,
“longitudinally spaced transverse lines . . . extending
substantially from the side edge to the fill edge,” even though
the patent claims and specification did not define “substantially
extend.” Id. at *15–16. This is because the court found the claim
language to be “defined in functional terms,” where the “function
of the transverse lines . . . is to permit facile separation of
the pouches.” Id. at *17. The range of the transverse lines’
possible lengths was finite, and a person skilled in the art
could test to determine what length allowed “facile separation of
the pouches,” depending on “the tensile strength and thickness of
the web material.” Id.
In Biosig Instruments, the Federal Circuit also found terms
of degree to be sufficiently definite when the terms depended on
the function of the claimed material. 783 F.3d at 1382-84. The
Federal Circuit held that a “spaced relationship” between
electrodes in a heart rate monitor was a sufficiently definite
term with proper bounds because the patent provided objective
standards that a person skilled in the art could test to ensure
the electrodes satisfied their function within the patent. Id.
For example, one objective standard included testing for the
“substantial removal of EMG signals from ECG signals.” Id.
at 1384 (quoting Biosig Instruments, Inc. v. Nautilus, Inc., 715
F.3d 891, 900–01 (Fed. Cir. 2013), vacated, 572 U.S. 898 (2014)).
Here too, “about” is sufficiently definite because the ‘633
Patent informs a person skilled in the art of the JFET width’s
function, which is to optimize between a lower on-resistance and
desired blocking voltage. (Shanfield Report (Doc. 103-2) at 17.)
A person skilled in the art could test the on-resistance and
blocking voltage to ensure the two are optimized to serve the
purpose of the MOSFET device, like how a person skilled in the
art could test for removal of EMG signals from ECG signals in
Biosig Instruments. See 783 F.3d at 1384. Accordingly, “about” is
a sufficiently definite term of degree in the claim term and does
not render the claim terms indefinite.
Relatedly, the lack of an upper bound does not render the
claim term “the JFET region having a width less than about three
micrometers” — indefinite. The claim term explicitly provides an
upper boundary of “three micrometers,” and the use of “about”
accounts for manufacturing variation during fabrication even when
the JFET width is “specified to exact values” during the “design
phase.” (See Shanfield Report (Doc. 103-2) at 17.)
Second, the lack of a lower bound does not render the claim
term — “the JFET region having a width less than about three
micrometers” — indefinite. While Defendant agrees that a width of
zero is “outside the scope of the claim because . . . [it] would
render the MOSFET device inoperable,” Defendant poses “the
question [of] what the minimum allowable width is.” (Def.’s
Opening Claim Construction Br. (Doc. 104) at 27.) However, when
the claim does not contain a lower bound, the claim “expressly
reach[es]” all operable devices with a “JFET region having a
width less than about three micrometers.” See Exxon Rsch. & Eng’g
Co. v. United States, 265 F.3d 1371, 1382 (Fed. Cir. 2001)
(explaining that a claim that did not include an upper limit on
particle diameter “expressly reach[ed]” all such particles with a
diameter greater than the stated minimum, and that “no limitation
[was] required as a matter of definiteness”). Failure to include
a size bound does not render a patent indefinite, as a person
skilled in the relevant art would know to create an operable
MOSFET under the guideline of a JFET region with a width less
than “about three micrometers.” Plaintiff agrees that “any
operable device with a JFET width less than about three
micrometers meets the claim limitation.” (Pl.’s Responsive Claim
Construction Br. (Doc. 117) at 11.) Defendant’s expert,
Dr. Doolittle, makes the same point. (Doolittle Report
(Doc. 104-1) at 42 (“The patent does not limit the JFET width to
a minimum of one micron or disclaim values between zero and
one.”).) This is particularly true when a shorter JFET region
width is desirable for reducing the on-resistance of the MOSFET,
thereby increasing its efficiency. A person skilled in the
relevant art is informed, “with reasonable certainty,” of “the
scope of the invention,” so the lack of a lower bound does not
render the claim term indefinite. See Nautilus, 572 U.S. at 901.
Although merely persuasive to this court, the Western
District of Texas, when also construing “about three micrometers”
in the ‘633 Patent for indefiniteness, reached the same
conclusion. See Claim Construction Order and Memorandum in
Support Thereof at 30, Trustees of Purdue Univ. v.
STMicroelectronics Int’l N.V., No. 6:21-cv-727-ADA-DTG (W.D. Tex.
Dec. 14, 2022), Doc. 220.3
Third, the claim term — “the JFET region having a width of
about one micrometer” — is not indefinite due to the use of the
word “about” or due to the lack of a “range of acceptable widths
above and below one micron.” (Def.’s Opening Claim Construction
3 The parties in the Western District of Texas litigation
did not raise the issue of whether the ‘633 Patent specifies
where the JFET region’s width is measured. Accordingly, this
court does not find the Western District of Texas’s construction
of the term, “about three micrometers,” persuasive to the degree
that term may be rendered indefinite based on Defendant’s concern
about where the JFET region’s width is measured.
Br. (Doc. 104) at 33.) As explained previously, the use of terms
of degree like “about” do not render a claim indefinite. A width
of “about” or “approximately” one micrometer appears
straightforward on its face, requiring no narrowing of the claim
scope. See, e.g., Home Diagnostics, Inc. v. LifeScan, Inc., 381
F.3d 1352, 1358 (Fed. Cir. 2004) (“Absent a clear disavowal or
contrary definition in the specification or the prosecution
history, the patentee is entitled to the full scope of its claim
language.”). This claim term is in Claim 10, which is dependent
on Claim 9. As such, reading Claim 10 in context of Claim 9, even
if an upper bound is necessary, a person skilled in the relevant
art would understand there to be an upper bound to the JFET
region’s width of “about three micrometers.” Accordingly, this
claim term informs a person skilled in the relevant art “with
reasonable certainty” of “the scope of the invention,” so it is
not indefinite. See Nautilus, 572 U.S. at 901.
In sum, this court finds that neither of those two claim
terms are indefinite based on the arguments presented and that no
construction is necessary. However, as will be addressed in a
separate order, this court is concerned that Defendant’s argument
about the ‘633 Patent’s lack of guidance on where the JFET
region’s width is measured may impact this court’s conclusions
concerning the term “width” within the two claim terms at issue
here.
Iv. CONCLUSION
For the foregoing reasons, this court construes the disputed
terms as follows:
Court’s Construction
“a first source electrode No construction necessary
formed over the first source
region” / “a second source
electrode formed over the
second source region” (Claim
9)
“a JFET region defined between |No construction necessary
the first source region and
the second source region”
(Claim 9)
“the JFET region having a No construction necessary,
width less than about three subject to supplemental
micrometers” (Claim 9) briefing
“the JFET region having a No construction necessary,
width of about one micrometer” | subject to supplemental briefing
(Claim 10, depends from Claim
9)
IT IS SO ORDERED.
This the 7th day of August, 2023.
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